Mousa, M., and M. J. Hagmann. “Analysis of Generating a Microwave Frequency Comb in Laser-Assisted Scanning Tunneling Microscopy With a Semiconductor Sample: Analysis of Generating a Microwave Frequency Comb in Laser-Assisted Scanning Tunneling Microscopy With a Semiconductor Sample”. Jordan Journal of Physics, vol. 18, no. 4, Oct. 2025, pp. 455-66, https://jjp.yu.edu.jo/index.php/jjp/article/view/271.