N. WANDERKA; H. KROPF; M. TIMPEL. Morphological Characterization of Eutectic Si and Ge Phases in the Corresponding Al-15Si and Al-20Ge Alloys Using FIB Tomography. Jordan Journal of Physics , [S. l.], v. 11, n. 1, 2025. Disponível em: https://jjp.yu.edu.jo/index.php/jjp/article/view/775. Acesso em: 27 apr. 2025.