MOUSA, M.; HAGMANN, M. J. Analysis of generating a microwave frequency comb in laser-assisted scanning tunneling microscopy with a semiconductor sample: Analysis of generating a microwave frequency comb in laser-assisted scanning tunneling microscopy with a semiconductor sample. Jordan Journal of Physics , [S. l.], v. 18, n. 4, p. 455–466, 2025. Disponível em: https://jjp.yu.edu.jo/index.php/jjp/article/view/271. Acesso em: 5 dec. 2025.