Reflection of Polarized Light at Quasi-Index-Matched Dielectric-Conductor Interfaces

Abstract

Quasi-index-matched (QIM) dielectric-conductor interfaces are characterized by a unit-magnitude complex relative dielectric function, ε= exp(- jθ ),0 ≤ θ ≤ π,  and exhibit minimum reflectance at normal incidence. Their reflection properties are analyzed in detail as functions of the incident linear polarization (p or s), angle of incidence ϕ and θ. Complex-plane trajectories of the Fresnel reflection coefficients r_p(ϕ), r_s(ϕ) and their ratio p(ϕ)= r_p /r_s= tanΨ exp(jΔ) as ϕ increases from 0 to 90° are presented at discrete values of θ, Absolute values and phase angles of  r_p, r_s and p are also plotted as functions of ϕ, Finally, the pseudo-Brewster angle of minimum |r_p|, the second-Brewster angle of minimum |p|, the principal angle at which Δ= π / 2 , and the special angle (ϕ= sin^-1 √ 0.5secθ) at which δ_p  = arg(r_p) = ±πof QIM interfaces are determined as functions of θ.

Keywords: Physical optics; Reflection; Interfaces; Polarization; Dielectric function; Ellipsometry.

PACS: 42. Optics.