A Semi-Empirical D-L Correlation for Profiling and Parameterizing Alpha Particle Tracks in Nuclear Detector CR-39 at Various Etching Temperatures

Abstract

Abstract: Imaging track profiles and directly measuring their lengths is more challenging than imaging and measuring their diameters. This paper focuses on determining alpha-particle track profiles and lengths in the CR39 nuclear detector by utilizing the track’s diameter-length (D-L) correlation to obtain actual track lengths from direct measurements of track diameters. Alpha particles with energies ranging from 3.5 to 5.3 MeV were used to irradiate the detector, which was then etched with a 6.25N NaOH solution at varying temperatures. The track parameters, such as the experimental bulk etch rate (VB), alpha energies, etching temperatures, and etching times, were input into the Track-Test program to calculate theoretical track lengths and create D-L calibration curves based on the Green et al. equation. The measured track diameters were projected onto curves to extract semi-empirical track lengths (L), track depth (x), etch rate (VT), etch rate ratio (V), and residual range (R'). MATLAB was used to plot the relationship between V and R', enabling the determination of optimal V(R') curves and new coefficients for the Green et al. equation. Using these newly derived coefficients, the Track-Test program applied the Green et al. equation to determine the profiles and evolution stages of the tracks. The D–L correlation method yielded track lengths and associated parameters that were consistent with direct microscopic measurements. This approach offers a viable, efficient, and straightforward alternative to direct imaging of longitudinal track profiles, which often demands considerable time, effort, and specialized techniques. Overall, the D–L correlation method provides reliable results comparable to those obtained from direct track-length measurements and thus represents a valuable tool for determining actual track lengths in nuclear detector applications.