Analysis of generating a microwave frequency comb in laser-assisted scanning tunneling microscopy with a semiconductor sample
Analysis of generating a microwave frequency comb in laser-assisted scanning tunneling microscopy with a semiconductor sample
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Upon the request of Dr Mmark Hagmann (attached email): Marwan S. Mousa will be the first author of this paper and Mark hagmann the second.Abstract
Abstract: When a mode-locked laser is focused on the tunneling junction of a scanning tunneling microscope optical rectification generates microwave harmonics at integer multiples of the laser pulse repetition frequency. These harmonics set the present state-of-the-art for a narrow-linewidth microwave source because of the high stability of passive mode-locking in the laser. Hundreds of harmonics are measured with a signal-to-noise ratio exceeding 25 dB with a metal sample in the STM. However, the harmonics are attenuated by the spreading resistance with a resistive sample. Now the spreading resistance is quantified and analysis with equivalent circuit models is used to characterize the effects to support further measurements with semiconductors.
